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关键词：
High-Resolution X-Ray Scattering
- From Thin Films to Lateral Nanostructures
书目信息
ISBN：
9780387400921（13位）
中图分类号：
O4
杜威分类号：
中文译名：
高分辨率X射线散射：从薄膜到横向纳米结构
作者：
Pietsch
编者：
语种：
English
出版信息
出版社：
Springer
出版地：
出版年：
2004
版本：
2nd ed.
版本类型：
原版
丛书题名：
Advanced Texts in Physics
卷期：
文献信息
关键词：
Physics
前言：
摘要：
内容简介：
The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.
目次：
Part I: Experimental Realization 1. Elements for Designing an X-Ray Diffraction Experiment 2. Diffractometers and Reflectometers 3. Scans and Resolution in Angular and Reciprocal Space Part II: Basic Principles 4. Basic Principles 5. Kinematic Theory 6. Dynamical Theory 7. Semikinematic Theory Part III: Determination of Layer Thicknesses of Signle Layers and Mutlilayers 9. Lattice Parameters and Lattice Strains in Single Epitaxial Laers and Multilayers 10. Diffuse Scattering From Volume Defects in Thin Layers 11. X-Ray Scattering by Rough Multilayers Part IV: X-Ray Scattering by Laterally Constructed Semiconductor Nanostructures 12. X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures 13. Strain Analysis in Periodic Nanostructures 14. X-Ray Scattering From Self-Organized Structures References Index.
附录：
全文链接：
读者对象：
grad.
实体信息
页码：
装帧：
hard
尺寸：
其它形态细节：
其它信息
原价：
EUR
99.9500
原版ISBN：
其它ISBN：
图书特色：
书评：
扩展信息
Isbn：
0387400923
issue：
2006JC01
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