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关键词：
Advances in Imaging and Electron Physics
书目信息
ISBN：
012374217X（10位）
9780123742179（13位）
中图分类号：
O4 物理学
杜威分类号：
中文译名：
成像与电子物理学进展
作者：
Hawkes
编者：
语种：
eng
出版信息
出版社：
ACADEMIC PRESS
出版地：
出版年：
2008
版本：
版本类型：
原版
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卷期：
文献信息
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前言：
摘要：
内容简介：
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as Academic Press, 1994 (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, Computer Techniques for Image Processing in Electron Microscopy, Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing
目次：
*I. Daubechies, G. Tesche and L. Vese, On some iterative concepts for image restoration *R.F.W. Pease, Significant advances in scanning electron microscopy 1965-2007 *J. M. Rodenburg, Ptychography and related diffractive imaging methods *J. Serra, Advances in mathematical morphology: segmentation
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读者对象：
College/higher education/Professional and scholarly
实体信息
页码：
288
装帧：
Hardback
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