当前位置:
首页
>
出版信息
>
详细信息
快速检索
数据库:
各中心已购纸本教材
各中心已购电子教材
国内高校课程
国外著名大学课程
外文原版教材出版信息
外文影印版教材出版信息
名校购书信息
关键词:
Nanoscale Characterization of Surfaces and Interfaces
书目信息
ISBN:
6611842934(10位)
9786611842932(13位)
中图分类号:
O3 力学 ; O4 物理学 ; P3 地球物理学 ; P14 天体物理学 ; Q6 生物物理学
杜威分类号:
中文译名:
作者:
Dinardo, John N.
编者:
语种:
eng
出版信息
出版社:
Wiley VCH
出版地:
出版年:
1994
版本:
版本类型:
原版
丛书题名:
卷期:
文献信息
关键词:
前言:
摘要:
内容简介:
Designed for solid state physicists and chemists, applied physicists and surface chemists, this text covers nanoscale characterization of surfaces and interfaces. Derived from the series, "Materials Science and Technology", it provides coverage of STM, AFM and related non-contact nanoscale probes, along with details applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the techniques, and many high-quality images demonstrate the power of these methods in the investigation of surfaces and the processes which occur on them. Topics covered include: scanning tunnelling microscopy; atomic force microscopy; semiconductor surfaces and interfaces; superconductors; electrochemistry at liquid-solid interfaces; biological systems; metrological applications; nanotribology; and manipulation on the nanoscale.
目次:
附录:
全文链接:
读者对象:
professional/vocational
实体信息
页码:
173
装帧:
尺寸:
其它形态细节:
其它信息
原价:
原版ISBN:
其它ISBN:
图书特色:
书评:
扩展信息
相关附件